| Introduction to the project |
The SuperSTEM project began in 1997 when Prof. Mick Brown presented a paper at the EMAG conference in Cambridge entitled "A Synchrotron in a Microscope".
The first instrument (SuperSTEM1) made use of the Cambridge VG HB 501 dedicated STEM. Aberration correction is achieved by retrofitting a Nion Mark II quadrupole-octupole corrector. As a result the spatial resolution was doubled from ~2 Å to 1 Å. Many new and important results have been obtained from this microscope but from the beginning it was clear that the 30 year old design of the VG microscopes were not optimised for aberration correction. Nion's response was to build an entirely new microscope (i.e. the UltraSTEM™ 100) that overcame these difficulties and SuperSTEM2 is the first such instrument in use for scientific research. Apart from optimised performance the UltraSTEM™ 100 has several features found in no other microscope such as 5th order aberration correction, a 2 Å electron probe mode with >0.5 nA current for rapid atomic-scale EELS mapping as well as a nano-diffraction mode.
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| What is spherical aberration ? |
In an aberration corrected microscope all rays are more or less brought to a common focus. This results in a sharper image. The SuperSTEM microscopes achieve a resolution of 1Å or better ; that's a millionth of the size of a single human hair! With aberration correction all electrons are focused within the region of interest, which in our case is the size of a single atom, so that it is possible to determine not just how individual atoms are brought together to form a bulk solid, but the chemical identity of those atoms as well. |